Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements
نویسندگان
چکیده
منابع مشابه
Time-resolved Z-scan measurements of optical nonlinearities
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency p that are due to the presence of a strong excitation at frequency oe. For example, in semicond...
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CMOS-compatible nonlinear optics platforms with high Kerr nonlinearity facilitate the generation of broadband spectra based on self-phase modulation. Our ultra - silicon rich nitride (USRN) platform is designed to have a large nonlinear refractive index and low nonlinear losses at 1.55 μm for the facilitation of wideband spectral broadening. We investigate the ultrafast spectral characteristics...
متن کاملMeasurement of nondegenerate nonlinearities using a two-color Z scan.
A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at frequency omega(p) owing to the presence of light at omega(e). This technique gives the nondegenerate two-photon absorption (2PA) coefficient beta(omega(p); omega(e)) and the nondegenerate nonlinear refractive index n(2)(omega(p); omega(e)), i.e., cross-phase modulation. We demonstrate this tech...
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In this paper, we use improved Z-scan and I-scan methods to analyze the refractive optical nonlinearities of the deoxyribonucleic acid (DNA) samples, which occur with continuous wave and femtosecond pulsed lasers and our proposed solutions to further improve both the methods and the nonlinear optical properties of DNA.
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2019
ISSN: 2045-2322
DOI: 10.1038/s41598-019-46865-7